MUMBAI, India, Sept. 7 -- Intellectual Property India has published a patent application (202617084853 A) filed by Jfe Steel Corporation on July 10, 2026, for Warpage Amount Measurement Method For Rolled Material, Warpage Amount Reduction Method, Warpage Amount Measurement Device, Warpage Amount Reduction Device, Learning Method For Warpage Measurement Model, And Warpage Measurement Model.

Inventors include Matsuoka Ryohei; Ogasahara Tomoyoshi; Komatsubara Hiroaki; and Urabe Motohiko.

The application for the patent was published on September 04, 2026, under issue no. 36/2026.

Abstract: Provided is a technique for measuring the amount of warpage in a rolled material, where the amount of warpage in the rolled material can be accurately measured. Provided is a warpage amount measurement method for a rolled material, where the amount of warpage in a rolled material is measured before and after a rolling mill on a hot rolling line, wherein: a camera capable of measuring luminance in a wavelength band from visible light to near infrared is used to capture an image of the rolled material after rolling from diagonally above the rolled material; the captured image of the rolled material is input into a warpage measurement model created in advance by machine learning; regions where the plate widths of the tip and tail end parts of the rolled material are reduced are estimated; a measured image region to be used in the measurement of the warpage amount is identified; a plate width edge part of the rolled material is detected on the basis of the luminance value of the image of the rolled material present in the measured image region; the image of the rolled material is divided along the rolling direction of the rolled material; the shapes of the plate width edge parts in the divided images are approximated by a quadratic expression; and the warpage amount of the rolled material is quantified by the curvature or the warpage height thereof on the basis of the shapes of the plate width edge parts approximated by the quadratic expression.

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