MUMBAI, India, June 30 -- Intellectual Property India has published a patent application (202541059553 A) filed by Indian Institute Of Science on June 21, 2025, for Systems And Methods For Thermal Characterization Of Materials At Nanoscale.
Inventors include Ambarish Ghosh; Eklavy Vashist; and Brateen Pal.
The application for the patent was published on June 26, 2026, under issue no. 26/2026.
Abstract: ABSTRACT SYSTEMS AND METHODS FOR THERMAL CHARACTERIZATION OF MATERIALS AT NANOSCALE The present disclosure generally relates to nanotechnology and quantum sensing systems, and more particularly relates to a method and system for thermal characterization of a target material at nanoscale. The system 100 may include one or more quantum sensors 208 positioned proximate to a target material 206, one or more excitation sources 210 configured to apply a periodically modulated excitation to generate periodic temperature variations within the target material 206, an optical detection unit 212 configured to detect an optical response of the one or more quantum sensors 208 resulting from the periodic temperature variations, and a processing unit 214 configured to obtain at least one of an amplitude response and a phase response of the optical response as a function of modulation frequency and determine one or more thermal properties of the target material 206 based on the obtained amplitude response and/or phase response. [FIG. 1 is a reference figure]
Disclaimer: Curated by HT Syndication.
