MUMBAI, India, Oct. 26 -- Intellectual Property India has published a patent application (202641123768 A) filed by Vellore Institute Of Technology on October 15, 2026, for System For Statistical Quality Control Of A Manufacturing Process Using Validated Frozen Control Limits.
Inventors include Dr Meenakshi Sp; and Munal Singh.
The application for the patent was published on October 23, 2026, under issue no. 43/2026.
Abstract: ABSTRACT SYSTEM FOR STATISTICAL QUALITY CONTROL OF A MANUFACTURING PROCESS USING VALIDATED FROZEN CONTROL LIMITS A system (100) for statistical quality control of a manufacturing process comprises a processor (102), a time-series measurement store (130) storing measurements of a characteristic, and a control-chart and special-cause rule engine (142) that judges samples against control limits and generates an alert when a sample violates a special- cause rule. A baseline validation and freezing module (144) computes candidate control limits from a candidate window and persists the candidate control limits as frozen control limits in a frozen baseline store (132) on condition that the candidate window comprises at least a minimum number of samples, has a dispersion above a floor defined relative to a magnitude of the measurements, and violates none of a disqualifying subset of special-cause rules, and otherwise refuses to freeze. A continuous monitoring engine (180) autonomously, at a fixed monitoring interval, judges a recent window against the unchanged frozen control limits. (Fig. 1)
Disclaimer: Curated by HT Syndication.
