MUMBAI, India, July 13 -- Intellectual Property India has published a patent application (202641081804 A) filed by Indian Institute Of Technology on July 02, 2026, for System And Terahertz Flexible Metasurface Sensor For Detection Of Ultra- Thin Analyte Layers Without Ultra-High-Q Resonance.
Inventors include Yogesh Kumar Srivastava; Prem Pal; Vanlalrinfela; and Bhawana Andola.
The application for the patent was published on July 10, 2026, under issue no. 28/2026.
Abstract: A terahertz flexible metasurface sensor and a terahertz sensing system for detection of ultra-thin analyte layers without requiring ultra- high-Q resonance operation are disclosed. The sensor includes a flexible low-loss dielectric substrate and a plurality of metallic resonator structures disposed on the substrate. Each metallic resonator structure includes a split-gap central cavity and half-cavity portions configured to spatially confine terahertz electromagnetic fields within an ultra-low effective electromagnetic mode volume, thereby increasing local photon density and enhancing light-matter interaction with an analyte material positioned proximate to the split-gap cavity. The sensing system further includes a signal processing module configured to receive terahertz transmission data, determine differential amplitude characteristics and/or differential phase characteristics between reference and analyte-exposed metasurface responses, and identify analyte-induced resonance perturbations below a spectral resolution limit of a terahertz measurement system. (Fig. 1)
Disclaimer: Curated by HT Syndication.
