MUMBAI, India, Oct. 5 -- Intellectual Property India has published a patent application (202631018256 A) filed by Ipfc-Giet University Cell on February 18, 2026, for System And Method For Predicting Crop Yield.
Inventors include Asish Kumar Patnaik; Dr. Neelamadhab Padhy; Dr. Lov Kumar; Dr. Rasmita Panigrahi; and Archana Patnaik.
The application for the patent was published on October 02, 2026, under issue no. 40/2026.
Abstract: ABSTRACT SYSTEM AND METHOD FOR PREDICTING CROP YIELD The present disclosure provides a method (200) for predicting a crop yield in a field 5 (101). The method (200) is performed by a system (100) comprising a plurality of sensors (102), at least one processor (106) and a database (108), the method (200) comprises receiving (202) a plurality of parameters associated with the field (101), the plurality of parameters being received in digital format. The method (200) comprises converting (204) the plurality of parameters into linguistic format from 10 the digital format. The method further comprises determining (206) a suitable crop to grow in the field (101) and a corresponding score based on the plurality of parameters. The method (200) further comprises displaying (208) the determined suitable crop and the corresponding score on a terminal (110).
Disclaimer: Curated by HT Syndication.
