MUMBAI, India, Aug. 31 -- Intellectual Property India has published a patent application (202611071248 A) filed by Aionos India Private Limited on June 08, 2026, for System And Method For Multimodal Surface Defect Detection And Quantification.
Inventors include Arjun Nagulapally; and Ravi Katukam.
The application for the patent was published on August 28, 2026, under issue no. 35/2026.
Abstract: Exemplary embodiments of the present disclosure are directed towards a system and method for multimodal surface defect detection and quantification. The system receives RGB image data and three-dimensional surface data of an inspected component under controlled illumination conditions generated using light-based illumination operations. The received multimodal inspection data is synchronized, calibrated, registered, and aligned within a common coordinate space for enabling per-pixel fusion of RGB-based features and three-dimensional geometric features. Further, multimodal feature fusion operations are performed to generate a fused multimodal surface representation for detecting, segmenting, localizing, classifying, and quantifying surface defects. One or more defect-analysis models are utilized to generate defect maps and quantified defect parameters corresponding to detected surface defects. The system further performs defect analysis, predictive-maintenance processing, maintenance recommendation generation, and inspection-report generation for inspected structures and industrial components. Fig. 1
Disclaimer: Curated by HT Syndication.
