MUMBAI, India, Sept. 7 -- Intellectual Property India has published a patent application (202541082583 A) filed by Abhay Jith; Josee Bai Sreevilas Krishnan; and Ajith Kumar Puthenpurakkal Thankappan on August 30, 2025, for Scalable Digital Holography Apparatus And Method For Precision Non-Destructive Testing.
Inventor includes Abhay Jith.
The application for the patent was published on September 04, 2026, under issue no. 36/2026.
Abstract: ABSTRACT SCALABLE DIGITAL HOLOGRAPHY APPARATUS AND METHOD FOR PRECISION NON-DESTRUCTIVE TESTING The present invention discloses a scalable digital holographic apparatus (100) and method for precision non-destructive testing, deformation measurement and defect detection of objects (125) having different sizes. A coherent light source (105) generates a coherent light beam (110) directed through a turret (115) having selectable beam expanders and matched pinholes to produce a spatially filtered expanded beam (120). The expanded beam (120) illuminates the object (125) to generate an object beam (140), while a variable reflectivity element (130) generates a reference beam (145) having controlled intensity distribution corresponding to the expanded beam (120). A narrow-band filter (150) suppresses unwanted ambient light, and a digital camera (155) records interference between the object beam (140) and reference beam (145) as a digital hologram (200). A computer (160) numerically reconstructs the holograms. A stress applicator (135) applies mechanical or radiant perturbation, enabling recording of an initial hologram H0 and successive holograms H1–HN for generating deformation fringes (300) and identifying stress, strain, cracks, voids and debonding. The components are housed in an enclosure (165) supported by a base (170), providing a portable field-level NDT apparatus. Figure-1
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