MUMBAI, India, Oct. 26 -- Intellectual Property India has published a patent application (202617090271 A) filed by Jfe Steel Corporation on July 24, 2026, for Quality Factor Determination Device And Quality Factor Determination Method.
Inventors include Kuyama Shuji; Nakagawa Hiroshi; Takagi Hiroyuki; Maitake Koji; and Hirano Yuichiro.
The application for the patent was published on October 23, 2026, under issue no. 43/2026.
Abstract: A quality factor determination device 1 is used in a batch production facility having the functions of setup calculation and dynamic control. The quality factor determination device 1 comprises a calculation unit 30. The calculation unit 30 acquires first classification information on the basis of a first threshold value and an operation variation range in a batch calculated on the basis of operation record data, acquires second classification information on the basis of a second threshold value and an operation representative value in the batch calculated on the basis of the operation record data, presents the first threshold value as an allowable value of the operation variation range to be suppressed by dynamic control when a first determination result is obtained, and presents the second threshold value as an optimal setting value in the setup calculation when a second determination result is obtained.
Disclaimer: Curated by HT Syndication.
