MUMBAI, India, Sept. 22 -- Intellectual Property India has published a patent application (202617086477 A) filed by Kabushiki Kaisha Toshiba on July 15, 2026, for Particle Measurement Device, Method, And Program.
Inventors include Hashimoto, Yuta; Mizuuchi, Rieko; Torii, Moriaki; Hu, Jinyang; Noda, Shuhei; Kakinuma, Kenji; and Hayami, Tokusuke.
The application for the patent was published on September 18, 2026, under issue no. 38/2026.
Abstract: Provided is a particle measuring device that can be realized at a low cost and that can measure particles with easy operation. According to an embodiment, this particle measurement device comprises: a light source that supplies illumination light for illuminating particles in a liquid; an imaging unit that images the illumination light that has passed through the particles; and a measurement unit that measures the distance between the particles and the imaging unit on the basis of the transmitted light intensity of the illumination light captured by the imaging unit and the known particle size and refractive index of the particles.
Disclaimer: Curated by HT Syndication.
