MUMBAI, India, June 24 -- Intellectual Property India has published a patent application (202617065669 A) filed by Orbem Gmbh on May 25, 2026, for Method For Enabling High-Throughput Imaging Of Industrial Samples.
Inventors include Coello, Eduardo; Skinner, Jason Graham; Schtzenberger, Anna; Knowles, Benjamin Richard; Kaorri, Aldo; Gmez Damin, Pedro Agustn; Molina Romero, Miguel; and Laparidou, Maria.
The application for the patent was published on June 12, 2026, under issue no. 24/2026.
Abstract: The invention relates to a Method for automated non-invasive analysis of a predetermined feature in a multitude of industrial samples (100) of a predefined sample type, the method comprising the steps of: b) recording in a preparation MRI experiment first MRI data of the industrial sample (100) with the MR scanner (102) to obtain a navigator information comprising the recorded first MRI data, c) analysing the navigator information with an inference module (200) for deriving one or more MR experimental parameters for use in a subsequent MR experiment for the analysis of the predetermined feature in the industrial sample (100) using a machine learning module (202), d) recording in a subsequent MR experiment MR data of the industrial sample (100) with the MR scanner(102) using the derived one or more MR experimental parameters, and e) analysing the predetermined feature in the industrial sample (100) using the MR data of the industrial sample (100), wherein the machine learning module (202) is trained for deriving one or more MR experimental parameters for use in a subsequent MR experiment for the analysis of the predetermined feature in the industrial sample (100) by analysing navigator information using a training set comprising navigator information of different training samples and corresponding MR experimental parameters used in a subsequent MR experiment for the analysis of the predetermined feature in the training sample.
Disclaimer: Curated by HT Syndication.
