MUMBAI, India, Aug. 12 -- Intellectual Property India has published a patent application (202611071112 A) filed by Indian Institute Of Technology, Roorkee on June 08, 2026, for Method For Detecting Heavy Metal Ions In A Sample.
Inventors include Sankar, Muniappan; Bhardwaj, Varusha; and Thakur, Pradeep Singh.
The application for the patent was published on August 07, 2026, under issue no. 32/2026.
Abstract: A method for detecting heavy metal ions in a sample is disclosed. The method comprises contacting the sample with meso-tetrakis(4- hydrazidocarbonylphenyl)porphyrin at a temperature in the range of 25 to 40 ºC; and detecting a change in an optical property of the meso-tetrakis(4- hydrazidocarbonylphenyl)porphyrin thereby detecting the heavy metal ions in the sample. A test strip sensor for detecting heavy metal ions in a sample is also disclosed. The methods and the sensor provide a low cost and simple solution for detecting the heavy metal ions in industrial and environmental samples.
Disclaimer: Curated by HT Syndication.
