MUMBAI, India, Oct. 5 -- Intellectual Property India has published a patent application (202641114693 A) filed by National Institute Of Technology, Tiruchirappalli on September 24, 2026, for Method And System For Spatial Crop Yield Estimation.
Inventors include Jananardhanam, Niraimathi; and Saravanan, Subbarayan.
The application for the patent was published on October 02, 2026, under issue no. 40/2026.
Abstract: A computer-implemented method (700) for spatial crop yield estimation includes acquiring (702), from a plurality of data sources, multi-source agricultural data associated with an agricultural region. The method includes preprocessing (704) the acquired multi-source agricultural data to generate a plurality of features associated with the multi-source agricultural data, integrating (706) the plurality of features to generate a unified geospatial dataset, and preprocessing (708) the unified geospatial dataset to generate a machine-learning ready dataset. The method includes generating (710) a plurality of feature combinations from the machine-learning ready dataset and determining (712) an optimal feature combination from the plurality of feature combinations based on one or more performance metrics. The method includes generating (714) a spatial crop yield estimation map for the agricultural region based on the optimal feature combination and rendering (716) the spatial crop yield estimation map on an electronic device.
Disclaimer: Curated by HT Syndication.
