MUMBAI, India, July 7 -- Intellectual Property India has published a patent application (202621055640 A) filed by Grainkart Private Limited; and , India Chattisgarh India on May 01, 2026, for Method And System For Providing Grain Quality Profiling.
Inventors include Sanskar Tayal; Amit Kumar Gupta; Shreyas Kumar Tah; Varun Shukla; Aryash Shrivastava; and Anshul Satone.
The application for the patent was published on July 03, 2026, under issue no. 27/2026.
Abstract: ABSTRACT METHOD AND SYSTEM FOR PROVIDING GRAIN QUALITY PROFILING A method and system for providing grain quality profiling. The method 200 is implemented by at least one processor 104. The method 200 includes receiving at least one image of a plurality of grains. Further, the method includes processing the at least one image of the plurality of grains to isolate individual grains from the plurality of grains. Thereafter the method includes generating a four-channel tensor for each individual grain from the plurality of grains. Thereafter, the method includes classifying each generated four-channel tensor for each segmentation mask to assign a pre-defined quality category and a grain confidence score to each individual grain from the plurality of grains. Thereafter, the method includes aggregating the pre-defined quality category and a grain confidence score to each individual grain to compute batch-level statistics for the plurality of grains. [[
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