MUMBAI, India, June 24 -- Intellectual Property India has published a patent application (202617061932 A) filed by The University Of Tokyo; and Daicel Corporation on May 15, 2026, for Material For Forming X-Ray Structure Analysis Sample, And Method For Determining Molecular Structure Of Organic Compound Using Same.
Inventors include Sato, Sota; Fujita, Makoto; and Gondo, Keisuke.
The application for the patent was published on June 12, 2026, under issue no. 24/2026.
Abstract: Provided is a novel material for forming an X-ray structure analysis sample of an organic compound. A material for forming an X-ray structure analysis sample according to the present disclosure contains the metal complex crystal described below. Metal complex crystal: A metal complex crystal which is composed of a metal ion and a ligand that is coordinated to the metal ion. The metal complex crystal has a three-dimensional network structure that has regularly arranged vacancies, and the ligand includes a carboxylic acid-based ligand (c) and a pyridine-based ligand (p) in a combination of [I] or [II] described below. [I] A compound represented by formula (c1) and a compound represented by formula (p1) [II] A compound represented by formula (c2) and a compound represented by formula (p2)
Disclaimer: Curated by HT Syndication.
