MUMBAI, India, Sept. 22 -- Intellectual Property India has published a patent application (202611089263 A) filed by Ajay Kumar Garg Engineering College on July 22, 2026, for Legal Metrology Compliance Verification System.
Inventors include Dr. Suvarna Mujumdar; Kriten Singhal; Shruti Tyagi; Eakansh Kumar; Madhur Garg; Yash Chaudhary; and Vansh Tomar.
The application for the patent was published on September 18, 2026, under issue no. 38/2026.
Abstract: Disclosed is a legal metrology compliance verification system for packaged commodities. The system comprises a physical inspection station having a load cell assembly, a temperature sensor, and a camera that acquire, during a common inspection event, a weight reading, a temperature reading, and a product-label image of a packaged commodity. An edge processor assigns a common scan identifier and timestamp to the acquired readings and image. A digital acquisition module obtains online listing data corresponding to the packaged commodity from an e-commerce source. A field extraction module extracts declaration fields from the product-label image and the online listing data. A rule engine cross-validates the extracted declaration fields with the weight reading and the temperature reading and generates violation flags linked with the common scan identifier. Fig. 1 Dated July 21, 2026 / Mungalpara Jigneshbhai Chhaganbhai IN/PA-2640 Agent for the Applicant
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