MUMBAI, India, Sept. 28 -- Intellectual Property India has published a patent application (202641110719 A) filed by National Institute Of Technology Calicut, An Indian on September 15, 2026, for Intermittent Temperature Measurement System In A Microwave Chamber For Rapid Histopathology.
Inventors include Raghu Chandanakavu Variyam; and Alen James.
The application for the patent was published on September 25, 2026, under issue no. 39/2026.
Abstract: ABSTRACT INTERMITTENT TEMPERATURE MEASUREMENT SYSTEM IN A MICROWAVE CHAMBER FOR RAPID HISTOPATHOLOGY The present invention relates to a method and system for accurate temperature measurement inside a microwave chamber (2) using intermittent temperature measurement synchronized with microwave operation. The system consists of a modified microwave chamber (2) integrated with a thermocouple-based temperature sensing system (6) and a microcontroller-based control system (3) implementing non-blocking state machine architecture. The invention enables programmable heating cycles, exponential filtering for temperature stabilization, and safety fault detection. Actuators (4, 5) enable automated immersion cycles. Compared to traditional overnight processing, this system enables rapid tissue processing while maintaining tissue integrity. FIG. 2
Disclaimer: Curated by HT Syndication.
