MUMBAI, India, Sept. 22 -- Intellectual Property India has published a patent application (202611093386 A) filed by Paramount Instruments P Limited; Dr. Kamasetty Badarinath; Mr. Shresht Singh Saini; Ms. Haransh Saini; Mr. Duruth Kankara Bharath Reddy; Mr. Madur Aswartha Reddy; Mr. Pranav Ashok; Mr. Pranav Siddappa; Mr. Ashok Gurupadappa Gadavi; and Shashank B on July 31, 2026, for Intelligent Fabric Inspection And Thread Density Measurement System Using Machine Learning.
Inventors include Dr. Kamasetty Badarinath; Mr. Shresht Singh Saini; Ms. Haransh Saini; Mr. Duruth Kankara Bharath Reddy; Mr. Madur Aswartha Reddy; Mr. Pranav Ashok; Mr. Pranav Siddappa; Mr. Ashok Gurupadappa Gadavi; and Shashank B.
The application for the patent was published on September 18, 2026, under issue no. 38/2026.
Abstract: The Present invention relates to an intelligent fabric inspection and thread density measurement system (100) and method (200) for continuous automated inspection of a moving fabric web. An image acquisition module (110) with a line-scan camera assembly (112) and a structured illumination assembly (114) produces an encoder- synchronised image stream; a pre-processing module (120) outputs selvedge-cropped tiles; a weave pattern analysis module (130) yields a frequency-domain periodicity descriptor and a spatial-domain lattice of interlacing points; a thread density measurement engine (140) computes warp and weft densities as a confidence- weighted combination of both; a machine-learning defect detection engine (150) with a convolutional classifier (152) and a semantic segmentation network (154) produces defect bounding boxes whose confidence is calibrated against the said lattice; an adaptive threshold and calibration module (160) self-calibrates on fabric-type change; and a reporting and control interface (170) emits closed-loop control signals to a loom.
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