MUMBAI, India, July 13 -- Intellectual Property India has published a patent application (202647082932 A) filed by Measure-Ipr Aps on July 06, 2026, for Doppler Effect Based Deflectometry System And Method Using Multiple Reference Sensors.
Inventors include Sloth Jensen, Kre; and Hi, Lasse.
The application for the patent was published on July 10, 2026, under issue no. 28/2026.
Abstract: A system and method for measuring the deflection of a surface subjected to a load. The optical system comprises a plurality of sensor heads, for the measurement of a doppler shift, each sensor head being configured to emit a laser beam towards a surface and a detector arranged to detect light reflected from that surface. A mounting beam fixes the plurality of sensor heads relative to each other along the mounting beam. Two or more of the sensor heads are reference sensors, the reference sensors being arranged together as a reference cluster, while at least one of the sensor heads is a deflection sensor arranged away from the reference cluster and at a region of high deflection of the surface. Based on emission of coherent laser beams and the detection of reflected light, the Doppler frequency may be determined and used to further determine the movement of the surface in an axial direction. The multiple reference sensors of the reference cluster provide a reference signal used to normalize the deflection sensor data and decrease the noise of the output.
Disclaimer: Curated by HT Syndication.
