MUMBAI, India, Oct. 5 -- Intellectual Property India has published a patent application (202541028954 A) filed by Nokia Technologies Oy on March 27, 2025, for Conformance Testing Of Ai/Ml Beam Management: Pre-Alignment And Generation Of Set A/B Beams.
Inventors include Mahendra, Rachit; and Syed Muhammad, Fahad.
The application for the patent was published on October 02, 2026, under issue no. 40/2026.
Abstract: For a TE for testing a DUT for conformance testing of a ML-based BM use case, receiving an indication that the DUT supports conformance testing of ML-based BM with at least a combination of test probes. The TE adjusts a configuration for the DUT and pre-test alignment information for the conformance testing. The TE sends an indication of the configuration and the pre-test alignment information to the DUT. The TE performs, based on the configuration and the pre-test alignment information, the conformance testing of the ML-based BM use case for the DUT. The DUT sends an indication to the TE that the DUT supports conformance testing of ML-based BM and receives an indication of a configuration and alignment information from the test equipment. The DUT configures information to be used for the conformance testing based on the configuration and the alignment information and performs the conformance testing. (Figure. 1)
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