MUMBAI, India, Sept. 28 -- Intellectual Property India has published a patent application (202641114140 A) filed by Vellore Institute Of Technology on September 23, 2026, for Computer-Implemented Method And System For Multi -Region Optical Measurement With Reliability- Gated Cross-Region Consistency Analysis.
Inventors include Thanuja; Mohan Babu A; Sayee Adithya S R; and Mohammed Saad C.
The application for the patent was published on September 25, 2026, under issue no. 39/2026.
Abstract: [0039] A computer-implemented method and system for multi-region optical measurement processes image data by calibrating against a colour reference and segmenting regions. A representation is computed for each region. A single shared 5 vector is constrained to explain every admitted region simultaneously through stored operators, forming an over-determined joint fit. A two-factor reliability weight, derived from capture-quality data and fit residuals, is co-solved iteratively to a fixed point. Inconsistencies are localized by exclusion-influence and typed from the convergence trajectory. A typed state controls adaptive re-acquisition of further image data with 10 fault-class-conditioned parameter changes, subject to bounded iteration. A three-band hysteretic gate, self-scaling with the calibration residual, guarantees termination. This yields stable, device-independent measurements with reduced acquisition operations. [FIG. 1, FIG. 2]
Disclaimer: Curated by HT Syndication.
