MUMBAI, India, Nov. 2 -- Intellectual Property India has published a patent application (202641125346 A) filed by Vellore Institute Of Technology on October 21, 2026, for Apparatus And Method For Optically Qualified Incremental Impedance Measurement Of A Compacted Particulate Specimen.
Inventors include Kavitha Sambasivam; Ponharish Kumar. J; Vishnu Priya A; and Eraiyanbu B.
The application for the patent was published on October 30, 2026, under issue no. 44/2026.
Abstract: The present invention discloses an apparatus and method for measuring the incremental electrical response of a compacted particulate specimen (12) to load. The specimen is confined as a bed behind an optically accessible window (14) and loaded in increments. For each increment, a deformation field is imaged (28) synchronously with the complex impedance under boundary current patterns of differing spatial sensitivity selected by a multiplexer (18). Increments without non- affine displacement above a threshold are qualified. For an increment containing a localised rearrangement, the residual impedance change across the patterns is compared with the response predicted by a sensitivity model at the event position. A consistent residual is compensated and the increment retained, and an inconsistent one is excluded, with repeated failures invalidating the block. The impedance-load coefficient is accumulated over retained increments and released with a validity indication, or withheld.
Disclaimer: Curated by HT Syndication.
