MUMBAI, India, Aug. 10 -- Intellectual Property India has published a patent application (202617072740 A) filed by Horiba, Ltd. on June 11, 2026, for Analysis Device, Analysis System, Analysis Method, And Program.
Inventor includes Yamaguchi, Kazuki.
The application for the patent was published on July 31, 2026, under issue no. 31/2026.
Abstract: The objective of the present invention is to accurately calculate an amount of particulate matter without being affected by changes in the amount of light emitted onto the particulate matter. An analysis device (100) comprises: a holding member (1) that holds particulate matter (FP); a light source (3) that emits light toward an imaging target area (VA) including a holding area of the holding member (1) in which the particulate matter (FP) is held; a two-dimensional sensor (4) that images the imaging target area (VA); and a calculating unit (5) that calculates particle amount-related information relating to the amount of particulate matter (FP) on the basis of analysis image data acquired by employing the two-dimensional sensor (4) to image the imaging target area (VA) for use in analyzing the particulate matter (FP), and an impact resulting from a change in the amount of light from the light source (3) when the analysis image data were acquired, relative to a reference amount of light.
Disclaimer: Curated by HT Syndication.
