MUMBAI, India, June 26 -- Intellectual Property India has published a patent application (202514118807 A) filed by Guangdong Kelongwei Automation Equipment Co. , Ltd. on November 28, 2025, for An Iv Detection Mechanism For 0bb Silicon Wafers.
Inventors include Chen, Chunfu; and Su, Jincai.
The application for the patent was published on June 19, 2026, under issue no. 25/2026.
Abstract: The invention discloses an IV detection mechanism for 0BB silicon wafers, including two detection modules, both comprise a UVW base, a gold wire row test frame and a silver row test frame; the gold wire row test frame and the silver row test frame respectively move on the UVW base along the vertical direction; gold wires are installed on the gold wire row and silver rows are installed on the silver row test frame; the two detection modules move independently. In the IV inspection mechanism for 0BB silicon wafers, the double half-cells independently carry out 0BB IV inspection, so that both sides can independently lift up and down, and correction alignment can be performed in the UVW direction, so that the gold wires and silver rows are accurately aligned with the grid lines on the half-cell, the inspection efficiency is improved, and the productivity is increased.
Disclaimer: Curated by HT Syndication.
