MUMBAI, India, Sept. 14 -- Intellectual Property India has published a patent application (202611086819 A) filed by Suresh Gyan Vihar University on July 15, 2026, for An Intelligent Machine Learning Device For Automated Industrial Quality Inspection Processes.
Inventors include Dr. Sohit Agarwal; and Dr. Ritu Jain.
The application for the patent was published on September 11, 2026, under issue no. 37/2026.
Abstract: An intelligent machine learning device for automated industrial quality inspection is disclosed. The device integrates article detection, synchronized data acquisition, controlled illumination, edge inference, decision generation, local record storage, operator annotation, industrial communication, actuator control, and managed model updating. Captured inspection data is prepared locally and evaluated by a trained learning engine to classify conformity, identify defects, and support production responses. The device provides traceable inspection records and controlled adaptation for changing manufacturing conditions while remaining suitable for deployment near industrial production lines.
Disclaimer: Curated by HT Syndication.
