MUMBAI, India, Sept. 28 -- Intellectual Property India has published a patent application (202641114207 A) filed by Aditya Institute Of Technology And Management; K. Ananda Kumar; K. Sai Shri; P. Sai Tharun; Meesala Sudhir Kumar; Kurman Sangeeta; N. Rajani; and Pedada Priyanka on September 23, 2026, for An Artificial Intelligence-Based System And Method For Automated Detection And Classification Of Manufacturing Defects.
Inventors include K. Ananda Kumar; K. Sai Shri; P. Sai Tharun; Meesala Sudhir Kumar; Kurman Sangeeta; N. Rajani; and Pedada Priyanka.
The application for the patent was published on September 25, 2026, under issue no. 39/2026.
Abstract: The present disclosure relates to an artificial intelligence-based system (100) for detection and classification of manufacturing defects is disclosed. System (100) comprises an imaging and sensor unit (104), a data processing module (107), a feature extraction module (108), an AI/ML defect detection and classification module (109), and a quality assessment and decision module (110). The imaging and sensor unit (104) acquires inspection data, which is processed to generate features. The AI/ML defect detection and classification module (109) detects a manufacturing defect and determines a defect class and parameters (112) comprising location, type, size, severity and confidence. The quality assessment and decision module (110) generates an inspection result (111) and action or alert (113). An inspection parameter control module (114), model repository (115), historical database (116), and process data interface (117) enable adaptive inspection and updating.
Disclaimer: Curated by HT Syndication.
