MUMBAI, India, Sept. 14 -- Intellectual Property India has published a patent application (202611086848 A) filed by Suresh Gyan Vihar University on July 16, 2026, for An Ai-Assisted Apparatus For Automated Defect Classification In Manufacturing Assembly Lines.
Inventors include Dr. Sohit Agarwal; and Dr. Ritu Jain.
The application for the patent was published on September 11, 2026, under issue no. 37/2026.
Abstract: An AI-assisted apparatus is disclosed for automated defect classification in manufacturing assembly lines. The apparatus acquires inspection data under controlled illumination, synchronizes capture with article movement, performs local artificial intelligence inference, maps model outputs to plant defect categories, and coordinates routing of suspect articles. Inspection events are stored with production context and may be reviewed by authorized personnel for validation. Confirmed events are prepared for controlled model improvement, thereby supporting consistent quality classification, traceability, responsive containment, and adaptive inspection performance during production.
Disclaimer: Curated by HT Syndication.
