MUMBAI, India, June 26 -- Intellectual Property India has published a patent application (202641072812 A) filed by Sai Vidya Institute Of Technology on June 12, 2026, for Ai-Enabled Automated Quality Inspection System For Accurate And Real-Time Defect Detection.
Inventors include Dr. Manjunath T N; Dr. T G Manjunath; Kavya S Balagod; Rituparna C; Rohini; Pushpalatha L B; and R S Charukesh.
The application for the patent was published on June 19, 2026, under issue no. 25/2026.
Abstract: The AI-Enabled Automated Quality Inspection System is designed to improve defect detection accuracy and enable real-time monitoring in manufacturing processes. Traditional manual inspection methods are often slow, inconsistent, and prone to human errors, leading to increased production costs and reduced product quality. This system uses Artificial Intelligence, Computer Vision, and Machine Learning techniques to automatically inspect products, identify defects, and classify issues with high precision. Cameras and sensors capture product images during production, while AI models analyze the data instantly to detect abnormalities such as cracks, shape variations, color defects, or missing components. The system provides real-time feedback, reduces inspection time, minimizes wastage, improves production efficiency, and ensures consistent quality standards. By integrating automation into quality control processes, manufacturers can achieve faster decision-making, reduced operational costs, and enhanced customer satisfaction.
Disclaimer: Curated by HT Syndication.
