MUMBAI, India, Sept. 28 -- Intellectual Property India has published a patent application (202621097435 A) filed by G. H. Raisoni College Of Engineering And Management; and Ghr Labs And Research Centre on August 12, 2026, for Ai-Based Adaptive Examination Difficulty Generator.
Inventors include Amarjeet Pal Cheema; and Manjusha Dandekar.
The application for the patent was published on September 25, 2026, under issue no. 39/2026.
Abstract: AI-BASED ADAPTIVE EXAMINATION DIFFICULTY GENERATOR An AI-based adaptive examination difficulty generator dynamically adjusts question difficulty in real time based on a student's ongoing performance. The system estimates initial ability through a diagnostic assessment, then continuously analyzes response accuracy, speed, and consistency using machine learning models to update the student's proficiency profile. An adaptive difficulty calculation algorithm selects subsequent questions from a difficulty-tagged, topic-classified question repository, converging toward each student's true ability level to maximize diagnostic precision while minimizing examination length. A feedback loop refines both individual student models and global question-bank calibration over time, enabling personalized, self- improving assessments suited for competitive examination preparation platforms such as NEET and JEE coaching institutes. [To be published along with Figure 1]
Disclaimer: Curated by HT Syndication.
