MUMBAI, India, July 13 -- Intellectual Property India has published a patent application (202641081448 A) filed by Mr. B. Venkata Ravi Kumar; Mr. L N Charyulu Rompicharla; Dr. Polepogu Rajesh; Dr. K. Parish Venkata Kumar; Dr. Palvadi Srinivas Kumar; Dr. Suresh Babu Chandolu; Dr. Muralidhar Vejendla; Ms. Bitta Vijayalakshmi; Mr. Kondapavuluri Karthikeya; and Mr. Vangara Naveen on July 01, 2026, for Adaptive Image Processing System For Industrial Quality Inspection And Control.
Inventors include Mr. B. Venkata Ravi Kumar; Mr. L N Charyulu Rompicharla; Dr. Polepogu Rajesh; Dr. K. Parish Venkata Kumar; Dr. Palvadi Srinivas Kumar; Dr. Suresh Babu Chandolu; Dr. Muralidhar Vejendla; Ms. Bitta Vijayalakshmi; Mr. Kondapavuluri Karthikeya; and Mr. Vangara Naveen.
The application for the patent was published on July 10, 2026, under issue no. 28/2026.
Abstract: The present invention relates to an adaptive image processing system for industrial quality inspection and control. The system includes an article detection unit, adaptive acquisition controller, image capturing unit, image normalization engine, defect analysis engine, defect confidence map generator, contextual decision engine and closed-loop control interface. The adaptive acquisition controller modifies imaging conditions such as exposure, lighting intensity, lighting angle and frame capture sequence when image quality or defect certainty is insufficient. The image normalization engine corrects captured image data for optical, positional and illumination variations. The defect analysis engine identifies candidate defect regions, and the defect confidence map generator assigns location, severity and confidence information to each defect region. The contextual decision engine compares defect information with product tolerance data to generate accept, reject, recheck, mark or divert decisions. The closed-loop control interface synchronises inspection decisions with industrial actuators for real-time production control and improved quality assurance. Accompanied Drawing [FIGS. 1- 2]
Disclaimer: Curated by HT Syndication.
