MUMBAI, India, Aug. 17 -- Intellectual Property India has published a patent application (202641096633 A) filed by Vellore Institute Of Technology on August 10, 2026, for A System And Method For Non-Invasive Prediction Of Baseplate Warpage In Igbt Power Modules.
Inventors include Dr. M. Thenmozhi; S. Dhanvikha; Afrin S Anish; Havish R; Joushwa Paul Durai Subash; and Chemmalar Selvi G.
The application for the patent was published on August 14, 2026, under issue no. 33/2026.
Abstract: A non-invasive condition monitoring system (100) and method for predicting baseplate warpage in an Insulated Gate Bipolar Transistor (IGBT) power module are disclosed. The system (100) acquires synchronized operating measurements comprising package temperature, heat sink temperature, collector-emitter voltage, collector current, gate-emitter voltage, gate current and cumulative operating time. A physics-informed feature engineering module computes thermal gradient, thermal stress, power dissipation, electrical stress, gate health, cumulative thermal damage and a thermo-electrical stress index. An Adaptive Physics-Informed Warpage Index is generated by applying exponential saturation mapping to the thermo-electrical stress index. The generated index is used for training and execution of one or more machine-learning models configured to predict the Adaptive Physics-Informed Warpage Index from synchronized operating measurements. A condition assessment module classifies the predicted index into predefined degradation zones corresponding to progressive degradation states of the IGBT power module.
Disclaimer: Curated by HT Syndication.
