MUMBAI, India, July 24 -- Intellectual Property India has published a patent application (202611057958 A) filed by Panipat Institute Of Engineering And Technology Piet on May 07, 2026, for A System And Method For Multi-Stress Crop Monitoring And Targeted Agronomic Response Using Multispectral Imaging, Environmental Sensing, And Adaptive Machine Learning.
Inventors include Prof. Dr. Poonam Panwar; and Prof. Dr. Satish Kumar.
The application for the patent was published on July 17, 2026, under issue no. 29/2026.
Abstract: [033] The present invention relates to an intelligent crop monitoring system and method for detecting multiple crop stress conditions in an agricultural field through the integrated use of multispectral imaging, environmental sensing, and machine learning-based analysis. The invention comprises a multispectral image acquisition unit configured to capture crop images across multiple wavelength bands, one or more environmental sensing units configured to collect field-related parameters, a communication interface for transmitting acquired data, and a processing unit configured to preprocess and analyze the data for identification of crop stress conditions including nutrient deficiency, disease incidence, and water stress. The processing unit further determines the severity and spatial distribution of the detected stress and generates crop stress maps and targeted agronomic recommendations relating to irrigation, nutrient application, disease control, and field inspection priority. The invention may further include a user interface module for displaying crop health outputs and an automation control interface for initiating corrective agricultural action. The present invention enables early, accurate, and scalable crop stress detection and supports efficient precision agriculture management. Accompanied Drawing [FIGS. 1-3]
Disclaimer: Curated by HT Syndication.
