MUMBAI, India, Sept. 28 -- Intellectual Property India has published a patent application (202621046344 A) filed by National Forensic Sciences University on April 10, 2026, for A Forensic Image-Based Anthropometric Measurement Framework With Landmark-Guided Scale Normalization From A 2d Image.
Inventors include Paheli Sharma; Saurabh Ratiram Patil; Vishal Arvindlal Mevada; Gargi Jani; Hardi Mendpara; Bhargav C. Patel; and Malay A. Shukla.
The application for the patent was published on September 25, 2026, under issue no. 39/2026.
Abstract: ABSTRACT A forensic image-based anthropometric measurement framework with landmark-guided scale normalization from a 2D image The present invention relates to a forensic image-based anthropometric measurement framework with landmark-guided scale normalization from a 2D image. The system receives a digital image and performs user-assisted scale calibration by selecting reference points corresponding to a known physical distance to establish a conversion between pixel coordinates and real-world units. The landmark detection module identifies anatomical landmarks associated with the face and/or body, from which anthropometric landmarks are extracted. The measurement computation module determines pairwise geometric distances and predefined anthropometric measurements, which are converted into standardized real-world units based on a scale normalization factor. The system generates structured outputs including measurement datasets, landmark coordinates, and annotated visual representations. The interactive visualization interface enables inspection, validation, and export of measurements. The invention provides a unified, non-contact, and scalable framework that improves measurement accuracy, consistency, and reproducibility, and is suitable for forensic examination, biometric analysis, and anthropological applications. Fig. 4
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