MUMBAI, India, Sept. 26 -- Intellectual Property India has published a patent application (202441020353 A) filed by Ge Precision Healthcare Llc, Wauwatosa, U.S.A., on March 19, 2024, for 'x-ray tube filament and filament driver circuit failure isolation.'
Inventor(s) include Sravan Vorem; Jean Francois Larroux; Yannick Louvrier; and Nicolas Levilly.
The application for the patent was published on Sept. 26, under issue no. 39/2025.
According to the abstract released by the Intellectual Property India: "Methods and systems are provided for detecting and identifying a degraded component of a filament drive circuit of an X-ray imaging system. In one example, the degraded component may be identified by including diagnostic capacitors at various location in the filament drive circuit, which may alter a resonant frequency of the filament drive circuit in the event of a degraded filament, cable, or different component of the filament drive circuit. During a diagnostic procedure, a voltage pulse may be performed on the filament drive circuit, and a resulting current may be measured and converted into a digital signal. The digital signal may be compared to a set of reference resonant frequencies stored in a lookup table in a memory of the X-ray imaging system, where a matching resonant frequency may indicate which component of the filament drive circuit is degraded."
Disclaimer: Curated by HT Syndication.
