Intellectual Property India Publishes Patent Application for 'X-Ray Diffraction Apparatus And Method For Analysing Packaged Samples' Filed by Malvern Panalytical B. V.

MUMBAI, India, Nov. 7 -- Intellectual Property India has published a patent application (202547095901 A) filed by Malvern Panalytical B. V., Almelo, Netherlands, on Oct. 6, for 'x-ray diffraction apparatus and method for analysing packaged samples.'

Inventor(s) include Kogan, Vladimir; and Beckers, Detlef.

The application for the patent was published on Nov. 7, under issue no. 45/2025.

According to the abstract released by the Intellectual Property India: "The present invention relates to a method and an X-ray diffraction apparatus for angular dispersive X-ray diffraction analysis of an analyte (sample) confined in a packaging (a "packaged sample"). The method comprises arranging a first primary X-ray optic between an X-ray source and the packaged sample to focus X-rays from the X-ray source into a focused X-ray beam of convergent or parallel X-rays and to direct the focused X-ray beam towards the packaged sample and arranging a first secondary X-ray optic between the packaged sample and an X-ray detector. The packaged sample is irradiated, by the X-ray source, with the focused X-ray beam of converging or parallel beam of X-rays, the X-rays having an energy greater than about 9 keV, while the analyte is confined in the packaging. The first secondary X-ray optic is configured such that a first portion of diffracted X-rays pass therethrough to be detected by the X-ray detector and a second portion of diffracted X-rays are prevented from being detected by the X-ray detector, wherein the first portion of diffracted X-rays come from a region within the packaging."

The patent application was internationally filed on Mar. 08, 2024, under International application No.PCT/EP2024/056238.

Disclaimer: Curated by HT Syndication.