MUMBAI, India, Aug. 8 -- Intellectual Property India has published a patent application (202414041123 A) filed by Henan Fuchi Technology Co. Ltd.; Hongfujin Precision Electronics (ZHENGZHOU) Co. Ltd.; Fu Tai Hua Industry (SHENZHEN) Co. Ltd.; Taiyuan Fuchi Technology Co. Ltd.; and Hon Hai Precision Industry Co. Ltd., Zhengzhou, China, on May 27, 2024, for 'testing device.'
Inventor(s) include Jinqiang Wang; Feng Lei; Fang Wang; Wutao Li; Qianghe Chang; and Gaochao Li.
The application for the patent was published on Aug. 8, under issue no. 32/2025.
According to the abstract released by the Intellectual Property India: "A testing device (100) includes a bearing bracket (10); a track mechanism (20) arranged on the bearing bracket (10), including at least one track; a carrier (30) configured to carry at least one motherboard to be tested, arranged in the track mechanism (20) and movable along the at least one track; a positioning mechanism (40) including at least one sensor arranged on one side of the bearing bracket (10) along an extension direction of the track mechanism (20), and configured to detect a position of the carrier (30); a detection mechanism (50) comprising a moving component (51) and a size detection sensor (52), the moving component (51) mounted on the bearing bracket (10), the size detection sensor (52) mounted on the moving component (51) and facing the carrier (30), configured to detect a deformation amount of the motherboard in the carrier (30); and a driving mechanism (60) arranged on the bearing bracket (10), including at least one driving component configured to drive the carrier (30) to move along the at least one track; the application can automatically detect the deformation amount of the motherboard, has high detection accuracy, improves detection efficiency, and is conducive to the realization of automation."
Disclaimer: Curated by HT Syndication.
