MUMBAI, India, Aug. 29 -- Intellectual Property India has published a patent application (202421013047 A) filed by Anantrao Pawar College Of Engineering And Research; and Padmakar Kelkar, Pune, Maharashtra, on Feb. 23, 2024, for 'systems and methods for vertical gate opening of radial gates using tilt angle measurement.'
Inventor(s) include Padmakar Kelkar.
The application for the patent was published on Aug. 29, under issue no. 35/2025.
According to the abstract released by the Intellectual Property India: "A system for precise determination of the vertical gate opening of a radial gate using tilt angle measurement, the system comprising: a tiltmeter sensor (200) affixed to a predefined structural position of the radial gate, configured to continuously measure angular displacement relative to a reference axis, the pre-defined structural position being within ranges defined as near horizontal as possible and as far as possible away from a centre point; a real-time clock (RTC) operatively coupled to the tiltmeter to provide time-synchronized measurement data; a signal conditioning module configured to process raw tilt data, compensating for sensor drift, temperature-induced deviations, and external vibrational noise; a computational processing unit (CPU) executing a trigonometric correction algorithm."
Disclaimer: Curated by HT Syndication.
