MUMBAI, India, Jan. 23 -- Intellectual Property India has published a patent application (202511122354 A) filed by K. R. Mangalam University, Gurugram, Haryana, on Dec. 5, 2025, for 'system for hybrid analog-ai fault diagnostics in electronic circuits.'
Inventor(s) include Dr. Shweta Bansal; Dr. Yogita Yashveer Raghav; and Dr Ruby Jindal.
The application for the patent was published on Jan. 23, under issue no. 04/2026.
According to the abstract released by the Intellectual Property India: "The present invention provides a hybrid diagnostic architecture that combines analog signal interpretation with artificial intelligence-based inference to detect, classify, and predict faults in electronic circuits. An analog front-end captures real-time circuit signatures including waveform characteristics, transient responses, and noise patterns, which are then preprocessed through a hybrid analog-digital feature extraction module. A machine-learning inference engine evaluates the extracted features to identify anomalies, classify fault conditions, and estimate degradation trajectories to enable predictive maintenance. The system adapts diagnostic thresholds dynamically based on evolving circuit behavior and environmental conditions, while an integrated communication interface delivers diagnostic insights to external devices or supervisory platforms. The hybrid analog-AI approach delivers enhanced precision, reduced false diagnostics, and low-power operation, enabling deployment across embedded systems, industrial electronics, consumer devices, and mission-critical platforms."
Disclaimer: Curated by HT Syndication.
