Intellectual Property India Publishes Patent Application for 'System For Agricultural Yield Forecasting And Quality Assessment' Filed by Lovely Professional University

MUMBAI, India, Dec. 13 -- Intellectual Property India has published a patent application (202511102291 A) filed by Lovely Professional University, Phagwara, Punjab, on Oct. 24, for 'system for agricultural yield forecasting and quality assessment.'

Inventor(s) include Dr. Sawinder Kaur Vermani; Dr. Ankur Bahl; Lavish Kansal; and Gaurav Gupta.

The application for the patent was published on Dec. 12, under issue no. 50/2025.

According to the abstract released by the Intellectual Property India: "A system for agricultural yield forecasting and quality assessment comprising, a data acquisition module 101 configured to collect meteorological parameters and crop image data, a preprocessing module 102 configured to clean and normalize input data, a model selection module 103 comprising a plurality of machine learning models including Recurrent Neural Networks (RNN), Convolutional Neural Networks (CNN), Random Forest (RF), Decision Trees (DT), Gradient Boosting Machine (GBM), Extreme Gradient Boosting (XGBoost), and Support Vector Machine (SVM), an evaluation module 104 configured to assess and compare model prediction performance using metrics including mean absolute error, root mean squared error, and coefficient of determination, an output interface configured to provide predicted crop yields and grading results."

Disclaimer: Curated by HT Syndication.