MUMBAI, India, May 29 -- Intellectual Property India has published a patent application (202641062243 A) filed by Dr. D. V. S. R. Anil Kumar; Ms. A. Meena; Ms. S. Malathi Padmaja; Ms. Ch. Rajeswari; Dr. J. Pramada; Mr. Y. V. Seshagiri Rao; and Mr. Venkata Sundaranand Putcha, Hyderabad, Telangana, on May 16, for 'system and method for industrial fault classification using super lattice measurable set structures.'
Inventor(s) include Dr. D. V. S. R. Anil Kumar; Ms. A. Meena; Ms. S. Malathi Padmaja; Ms. Ch. Rajeswari; Dr. J. Pramada; Mr. Y. V. Seshagiri Rao; and Mr. Venkata Sundaranand Putcha.
The application for the patent was published on May 29, under issue no. 22/2026.
According to the abstract released by the Intellectual Property India: "The invention discloses a system and method for industrial fault classification using super lattice measurable set structures. The system collects operating data from an industrial machine through sensors. The data is normalized and converted into elementary sensor-state regions. The elementary regions are arranged into a super lattice structure based on inclusion, severity, dependency, or operational risk. A measurable condition set builder forms industrial condition sets representing machine states. A fault classification engine compares a present industrial condition set with stored condition sets and assigns a fault class such as normal, caution, warning, critical, or shutdown-required. A decision and control module generates an industrial output including an alert, maintenance instruction, controller signal, or shutdown command. The invention improves interpretable fault classification, predictive maintenance, and machine safety."
Disclaimer: Curated by HT Syndication.
