MUMBAI, India, Feb. 13 -- Intellectual Property India has published a patent application (202511129085 A) filed by Aryatech Platforms Private Limited, Noida, Uttar Pradesh, on Dec. 19, 2025, for 'system and method for grain quality assessment.'
Inventor(s) include Rao, Margapuri Prasanna; Kumar, Sameer; Chandra, Anand; Rai, Navneet Kumar; Gattyani, Vaibhav; and Singh, Ankesh Kumar.
The application for the patent was published on Feb. 13, under issue no. 07/2026.
According to the abstract released by the Intellectual Property India: "The present disclosure relates to a system (102) and a method (300) for grain quality assessment. The system (102) receives images of grains using sensors, detects features of each of the grains from the received images using a model and extracts morphological parameters corresponding to each of the grains from the detected features. Further, the system (102) classifies the grains into quality categories based on the extracted morphological parameters and generates a quality assessment report of the grains by performing a fusion of the classified quality categories. The system (102) enables accurate, objective, and real-time evaluation of grain quality parameters including morphological and surface characteristics."
Disclaimer: Curated by HT Syndication.
