MUMBAI, India, May 29 -- Intellectual Property India has published a patent application (202611050917 A) filed by Indian Institute Of Technology, New Delhi, on April 21, for 'system and method for determining interlayer exchange coupling in a synthetic antiferromagnet multilayer structure.'
Inventor(s) include Sivasubramani, Santhosh.
The application for the patent was published on May 29, under issue no. 22/2026.
According to the abstract released by the Intellectual Property India: "A method (1000) for determining interlayer exchange coupling in a synthetic antiferromagnet multilayer structure comprises receiving (1002) a multilayer stack configuration (110) comprising magnetic layer regions and at least one spacer layer region between adjacent magnetic layer regions, generating (1004) for each interface between adjacent magnetic layer regions an interface descriptor data structure, determining (1006) for each interface descriptor data structure an oscillatory coupling strength value based on a spacer thickness value, generating (1008) a coupling field contribution for each mesh cell at an interface between a first and second magnetic layer region based on the oscillatory coupling strength value and a magnetization state of the mesh cell, creating (1010) an effective magnetic field buffer by accumulating coupling field contributions from all interface descriptor data structures, and updating (1012) a magnetization state based on the effective magnetic field buffer to obtain an interlayer exchange coupling state of the synthetic antiferromagnet multilayer structure."
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