MUMBAI, India, April 17 -- Intellectual Property India has published a patent application (202641042547 A) filed by Sr University, Warangal, Telangana, on April 2, for 'system and method for accurate and robust detection of wheat leaf diseases using optimized deep learning and adaptive image intelligence.'
Inventor(s) include Narendra Pal Singh Rathore; and Dr. Rupesh Kumar Mishra.
The application for the patent was published on April 17, under issue no. 16/2026.
According to the abstract released by the Intellectual Property India: "The present invention discloses a system and method for detecting AI-generated and digitally doctored images using a hybrid approach that integrates image forensic analysis with deep learning-based classification techniques. The system comprises modules for image acquisition, preprocessing, forensic feature extraction, deep learning-based analysis, and decision fusion to enhance detection accuracy and robustness. The invention further incorporates an anomaly detection mechanism for generating confidence scores and an explainability module for highlighting manipulated regions within images. The proposed system supports real-time processing, adaptive learning, and scalable deployment across cloud and edge environments, thereby providing an efficient and reliable solution for digital image authentication in applications such as cybersecurity, media verification, and digital forensics."
Disclaimer: Curated by HT Syndication.
