MUMBAI, India, June 16 -- Intellectual Property India has published a patent application (202611055128 A) filed by Teerthanker Mahaveer University, Moradabad, Uttar Pradesh, on April 30, for 'standoff imaging system and method for absolute distance measurement using self-mixing optical feedback interferometry.'
Inventor(s) include Dr. Vibhor Kumar Bhardwaj; Amita Thakur; Prof. Rakesh Kumar Dwivedi; and Prof. Surita Maini.
The application for the patent was published on June 5, under issue no. 23/2026.
According to the abstract released by the Intellectual Property India: "The invention relates to a standoff imaging system based on absolute distance measurement using self-mixing optical feedback interferometry (SM- OFI). It comprises a digitally controlled SM-OFI (I), a controllable XYtranslation stage (8), and a digital controller (5) to synchronize their operation. The system measures absolute distances point-by-point across an object's surface, creating a distance matrix that is converted into high-contrast binary or grayscale images representing the surface topology. The method offers a simple, low-cost, and scalable solution by avoiding complex optical setups and phase analysis. This system is suitable for wide-area industrial and biomedical imaging applications requiring precise, non-contact surface characterization. More precisely, the invention finds practical use in scanners and other imaging devices requiring precise, non-contact surface mapping for applications in industrial inspection, quality control, and biomedical imaging."
Disclaimer: Curated by HT Syndication.
