MUMBAI, India, April 10 -- Intellectual Property India has published a patent application (202544092385 A) filed by Nokia Technologies Oy, Espoo, Finland, on Sept. 26, 2025, for 'selective measurement occasion skipping.'
Inventor(s) include Pedersen, Klaus Ingemann; Paris, Stefano; and Kaikkonen, Jorma Johannes.
The application for the patent was published on April 10, under issue no. 15/2026.
According to the abstract released by the Intellectual Property India: "According to an aspect, there is provided an apparatus configured to perform the following. The apparatus receives, from an access node, a configuration indicating at least one of: one or more first measurement occasions of the apparatus to which received measurement occasion skipping indications are applicable; or one or more second measurement occasions of the apparatus to which received measurement occasion skipping indications are not applicable. The apparatus receives, from the access node, downlink control information comprising a measurement occasion skipping indication indicating that a measurement occasion is to be skipped. The apparatus determines, based at least on the received configuration, whether the measurement occasion is to be skipped."
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