MUMBAI, India, Jan. 9 -- Intellectual Property India has published a patent application (202511115559 A) filed by Manav Rachna University, Faridabad, Haryana, on Nov. 22, 2025, for 'robotic quality inspection system for precision manufacturing.'
Inventor(s) include Dr. Bhim Singh; Gianender Kajal; Tanay Mishra; Nikhil Jaiswal; Chayan Vyas; Neeraj Adhikari; Chetan; and Takshat Gaur.
The application for the patent was published on Jan. 9, under issue no. 02/2026.
According to the abstract released by the Intellectual Property India: "A system (100) for automated inspection and disposition of articles (102) is disclosed. The system (100) comprises a support structure (104) supporting a transport path (106), and a workpiece holder (108) presenting the article (102) along the transport path (106). A sensor array (110) having an imaging unit (112) acquires sensor data from the article (102). A controller (116) is operatively connected to the sensor array (110) to generate inspection results from said sensor data and to issue sorting commands. An actuator unit (122) is connected to the workpiece holder (108) to route the article (102) to a rework interface (126) based on the sorting commands. The system (100) enables automated quality assessment and disposition of articles (102) through integrated sensing, analysis, and actuation for improved accuracy and reduced manual intervention in industrial inspection processes."
Disclaimer: Curated by HT Syndication.
