MUMBAI, India, Sept. 26 -- Intellectual Property India has published a patent application (202517084121 A) filed by Jfe Steel Corporation, Tokyo, on Sept. 4, for 'quality defect diagnostic device and quality defect diagnostic method.'
Inventor(s) include Takagi, Hiroyuki; and Hirata, Takehide.
The application for the patent was published on Sept. 26, under issue no. 39/2025.
According to the abstract released by the Intellectual Property India: "This quality defect diagnostic device diagnoses quality defects occurring in products, and is provided with: a data dividing unit that divides product data to be diagnosed, which consists of operation data and quality data, into prescribed separate blocks in a two-dimensional manner; a data aggregation unit that extracts operation data for each predetermined quality defect classification on the basis of the tendency of occurrence of quality defects in the separate blocks, and aggregates the extracted operation data for each block and for each area including two or more blocks; a quality defect determination unit that determines whether or not a quality defect has occurred using a plurality of prediction models that each have been created for a respective quality defect classification and trained to learn the relationship between the aggregated operation data and the quality data; and a cause estimation unit that estimates the cause of the quality defect on the basis of the result of the determination for the quality defect."
The patent application was internationally filed on Feb. 06, 2024, under International application No.PCT/JP2024/003875.
Disclaimer: Curated by HT Syndication.
