MUMBAI, India, Aug. 22 -- Intellectual Property India has published a patent application (202517074024 A) filed by Ushio Denki Kabushiki Kaisha; and Daiichi Jitsugyo Viswill Co. Ltd., Tokyo, on Aug. 4, for 'product inspection system and product inspection method.'
Inventor(s) include Nakayama Koji; Fujimoto Masaya; Watanabe Katsuya; and Sahara Junki.
The application for the patent was published on Aug. 22, under issue no. 34/2025.
According to the abstract released by the Intellectual Property India: "This product inspection system comprises: a spectral measurement unit that measures the spectrum of a conveyed product; and a quality determination unit 44 that determines the quality of the product on the basis of the output obtained by inputting product spectral data measured by the spectral measurement unit into a trained model generated by machine learning. The trained model is generated by machine learning using training data including spectral data measured in mutually different positions."
The patent application was internationally filed on Jan. 22, 2024, under International application No.PCT/JP2024/001708.
Disclaimer: Curated by HT Syndication.
