MUMBAI, India, May 1 -- Intellectual Property India has published a patent application (202641050285 A) filed by Srm University, Amaravati, Andhra Pradesh, on April 20, for 'probe system for non-destructive electrical characterization of a device under test.'
Inventor(s) include Kaliyaperumal, Ramkumar; Govindarajan, Sneigitha; Iyyamperumal, Mukesh; and Mukhopadhyay, Sabyasachi.
The application for the patent was published on May 1, under issue no. 18/2026.
According to the abstract released by the Intellectual Property India: "A probe system (100) for non-destructive electrical characterization of a device under test. The system (100) includes a distributed micro-fiber brush (102) configured to establish electrical contact with a surface through a bundle of conductive micro-filaments. A compliant support structure (104) permits controlled mechanical deflection during contact. A piezoelectric sensing module (106) generates a transient electrical signal indicative of an initial contact event. A magnetic sensing assembly (108) comprising a magnet (110) and a magnetic field sensor (112) detects displacement of the compliant support structure (104) and generates a displacement signal corresponding to sustained engagement. A controller (114) detects initial contact, detects sustained engagement, and confirms stable electrical contact based on a predefined correlation condition between the signals. The system (100) performs electrical characterization upon confirmation of contact without requiring optical illumination or pre-contact electrical verification."
Disclaimer: Curated by HT Syndication.
