MUMBAI, India, Oct. 11 -- Intellectual Property India has published a patent application (202517091675 A) filed by Landis+Gyr Technology, Inc., Alpharetta, U.S.A., on Sept. 24, for 'method for use in determining the measurement functionality of a meter.'
Inventor(s) include Maclaury, Kyle.
The application for the patent was published on Oct. 10, under issue no. 41/2025.
According to the abstract released by the Intellectual Property India: "A method for use in determining the measurement functionality of a meter is disclosed herein, wherein the meter is configured for measuring raw data at one or more measurement locations around a system, wherein the measurement functionality of the meter defines the characteristics of measurement data which is derivable from the raw data, and wherein the method comprises identifying a set of different measurement points supported by the meter, identifying a set of different units of measure supported by the meter, and identifying a set of different data types supported by the meter. The method further comprises determining different combinations of measurement point, unit of measure, and data type selected from the set of different measurement points, the set of different units of measure, and the set of different data types respectively, and determining, for each combination of measurement point, unit of measure, and data type, a corresponding measurement type and a corresponding code of the metrology specification. The method may allow the functionality of a meter to be defined in terms of the different measurement types supportable by the meter and to be mapped to a metrology specification. The method may allow the functionality of any meter, for example a meter of arbitrary complexity, to be fully specified."
The patent application was internationally filed on Mar. 27, 2024, under International application No.PCT/US2024/021665.
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