MUMBAI, India, June 6 -- Intellectual Property India has published a patent application (202517017782 A) filed by Obshhestvo S Ogranichennoj Otvetstvennostyu Indikom, Saint-Petersburg, Russia, on Feb. 28, for 'method for determining the spatial profile of inspected objects.'
Inventor(s) include Grebenshchikov, Vladimir Vital'Evich; Vrubel', Ivan Igorevich; and Spirin, Denis Olegovich.
The application for the patent was published on June 6, under issue no. 23/2025.
According to the abstract released by the Intellectual Property India: "The operating principle of the method for determining the spatial profile of an inspected object via the backscatter inspection unit is based on registering the ionizing radiation scattered by the object of inspection towards the source. At the steps of the method are realizing: irradiating the inspected object with a pencil X-ray beam, registration of backscattered radiation with ionizing radiation detectors. Data accumulated within one pixel of radiographic image are transmitted to the processor, then the differential signal and the integral signal are computed, and the normal vector component of scattering surface is calculated. Then a pseudo-spatial profile of the inspected object is formed in the visualization device by displaying the normal vector component using the grayscale pixel coding. The invention provides improving its reliability, reducing the cost of its implementation and increasing the inspection accuracy due to improving the synthesized image quality."
The patent application was internationally filed on July 26, 2023, under International application No.PCT/RU2023/000228.
Disclaimer: Curated by HT Syndication.
